Atom probe

The atom probe is an atomic-resolution microscope used in materials science that was invented in 1967 by Erwin Müller, J. A. Panitz, and S. Brooks McLaneThe atom probe made one-dimensional compositional maps by combining time-of-flight spectroscopy and field ion microscopy (FIM). The instrument allows the three-dimensional reconstruction of up-to hundreds-of-millions of atoms from a sharp tip (corresponding to specimen volumes of 10,000-1,000,000 nm3).
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