ATPG

ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, and in some cases to assist with determining the cause of failure (failure analysis.) The effectiveness of ATPG is measured by the amount of modeled defects, or fault models, that are detected and the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration. It is influenced by the fault model under consideration, the type of circuit under test (full scan, synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transistor, switch), and the required test quality.
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Automatic Test Pattern Generation är ett sätt att automatisera testmönstergenereringen i tillverkningen av en integrerad krets. Man använder testmönster för att undersöka om en krets har fått defekter vid framställningen, defekter som orsakar fel funktion eller ingen funktion alls.
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自動測試圖樣產生(Automatic test pattern generation, ATPG) 系統是一種工具，產生資料給製造出來後的数字电路作測試使用。測試超大型積體電路，要達到非常高的錯誤涵蓋率()是非常困難的工作，因為它的複雜度很高。 針對組合邏輯(Combinatorial logic)和循序邏輯(Sequential logic)的電路測試，必須要使用不同的 ATPG 方法。
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Automatic Test Pattern Generation

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Acquires, develops and produces natural gasand oil properties primari ly in the outer continental shelf of the gulf of mexico.